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Non-Contact Mode :

 

AFM cantilever can be modeled as a mass- spring system as shown. The air molecules between the tip and sample surface play     the role of damping when imaging in air. Damping is provided by viscosity when scanning in liquid.

 

AFM Non-contact mode (Atomic force microscopy)

A dithering signal is applied and frequency response of the cantilever is swiftly obtained by Nano pacific_AFM. Typical of           dynamic curve is shown.

 

AFM Non-contact mode (Atomic force microscopy)

 

Zoom into the spectrum by drag and drop inside the spectrum

 

AFM Non-contact mode (Atomic force microscopy)

 

Typical cantilever used in non-contact mode is NSC 15 with the following characteristics :

 

Contilever

length

width

Thickness

Resonant FrequencyKHz Typical

Force Constant N/m Typical

 

µ

µ

µ

 

 

 NC15/AlBS

125

35

4

325

46

 

 

 

Atomic Force Microscopy Non-contact mode

1

Atomic Force Microscopy Non contact mode Atomic Force Microscopy Non-contact mode

23

 

to see catalog click on attachment :

Attachments:
Access this URL (http://nano-pacific.com.au/images/Mode/Non-contact/Catalog.zip)Catalog.zip[Non-contact mode]467 kB