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Lateral Force Microscopy

 

Nano pacific AFM is capable of recording the tensional rotation of the cantilever while scanning sample surface. the output of these data makes LFM image which shows the frictional properties of the sample. the principle is schematically shown as follows :

 

Lateral Force Microscopy Atomic Force Microscope mode

 

 

 

Lateral Force Microscopy Atomic force Microscopy

 

 

 

LFM images are shown in the following pictures; the left images is L-R Bwd and the right one L-R Fwd. the light areas on the left image (the dark ones on the right image) show a material with higher surface friction.

 

 

 

 

 

 

 

 

 

 

 

Lateral Force Microscopy Atomic force Microscopy

 

 

 

 

A Topo images of the same sample is shown in the following image.

 

 

 

Lateral Force Microscopy Atomic force Microscopy

 

 

 

 

 

 

 

 

 

 

 

Attachments:
Access this URL (http://nano-pacific.com.au/images/Mode/LFM/Catalog.zip)Catalog.zip[Lateral Force Microscopy]479 kB