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Atomic Force Microscope (AFM)

The main product of Nano-Pacific is Atomic Force Microscope (AFM). AFM as an important apparatus in the applied nano projects and industries related to nano technology, is now produced with the latest known AFM-modes and most developed hardware and software.

 

Adavantages of AFM

  • Scanning in Non-vacumed environment
  • No sample preparation needed
  • Moderate cost and ignored energy consumption
  • Wide application range
  • No restriction in sample material
  • Small occupying space
 multi-mode Atomic Force Microscopy

 

AFM MODELS
Modes Standard Model Advanced Model Full Model  Full Plus Model 
Contact Mode * *   *
Dynamic Mode  * * * *
tapping Mode  * * * *
Lateral Force Microscopy (LFM)  * * * *
Magnetic Force Microscopy (MFM)    * * *
Electric Force Microscopy (EFM)    * * *
Force Spectroscopy    * * *
Nano-Lithography(Chemical)     * *
Nono-Lithography(Mechanical)     * *
Force Modulation      * *
Kelvin Microscopy        *
CAFM        *
PRM        *

 

Main Software features

  • Advanced digital filtering
  • Improved error compensation
  • Fast Frequency Fesponse acquisition
  • Sample movement capabilities
  • Camera light intensity variations
  • Extensive control parameters variations
  • Zooming capability for scanning
  • Script language

Specification

 Parameter

 Value

 Scanning range  40-50 microns
 Lateral resolution  1 nano
 Vertical resolution  0.1 nano
 Laser power  1 mW
 Sensor bandwidth  7 MHz
 Actuator bandwidth  70 KHz
 Optical sensor sensitivity  0.18 A/W
 The approach steps  0.6 microns
 Sample movement range  7 mm